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Portable Oscilloscope Easily Performs Complex Data Analysis to Test Imaging Equipment

By MedImaging International staff writers
Posted on 17 Sep 2012
Image: With the 190M Medical ScopeMeter handheld oscilloscope, the complicated data analysis required to test imaging equipment is simple to learn, easy to use and quick to complete (Photo courtesy of PRNewsFoto / Fluke Corporation).
Image: With the 190M Medical ScopeMeter handheld oscilloscope, the complicated data analysis required to test imaging equipment is simple to learn, easy to use and quick to complete (Photo courtesy of PRNewsFoto / Fluke Corporation).
With a new handheld oscilloscope, the complicated data analysis required to test imaging equipment is simple to learn, easy to use, and quick to complete. It combines the capabilities of a digital multimeter with the performance of a bench oscilloscope and digital data storage/analysis of a paperless recorder so that a field technician can rapidly identify the true cause in complicated problems.

Fluke Biomedical (Everett, WA, USA), a global provider of medical device test and safety equipment, recently announced the debut of its new 190M Medical ScopeMeter. “Avoiding one unnecessary board change or even half a day of downtime saves a facility more dollars than the entire cost of a 190M,” explained Hongbo Chen, product manager for Fluke Biomedical. “To minimize downtime and repair costs, you need to get to the root cause of problems as quickly as possible. The 190M Medical ScopeMeter test tool offers a number of unique features that help you quickly set up the scope and diagnose difficult problems like intermittent events, signal fluctuations, or drift. Troubleshooting is easier with the 190M.”

Imaging equipment now utilizes sophisticated, interrelated technologies such as digital networking and video. In turn, this equipment needs equally sophisticated test equipment to ensure proper functionality and patient safety. Designed for equipment imaging and power quality troubleshooting, the 190M measures short-duration pulses, time-based signals, three-phase power measurements, and transient and electrical noise systems. High-resolution waveform analysis makes visual performance inspection fast and easy, while ideal waveform overlays allow for immediate pass/fail analysis of machine performance. The ability to record signals over time captures defects not visible to simple multimeters, and due to the record function, the 190M can be set to record when the machine is on.

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